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IEC 61747-20-2 : 1ED 2015
IEC 61747-20-2 : 1ED 2015 LIQUID CRYSTAL DISPLAY DEVICES - PART 20-2: VISUAL INSPECTION - MONOCHROME MATRIX LIQUID CRYSTAL DISPLAY MODULES (EXCLUDING ALL ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES) International Electrotechnical Committee
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IEC 62541-13 : 1ED 2015
IEC 62541-13 : 1ED 2015 OPC UNIFIED ARCHITECTURE - PART 13: AGGREGATES International Electrotechnical Committee
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IEC 61988-2-6 : 1ED 2015
IEC 61988-2-6 : 1ED 2015 PLASMA DISPLAY PANELS - PART 2-6: MEASURING METHODS - APL DEPENDENT GAMMA AND COLOUR CHARACTERISTICS International Electrotechnical Committee
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IEC PAS 62958 : 1ED 2015
IEC PAS 62958 : 1ED 2015 CLOTHES WASHING MACHINES FOR HOUSEHOLD USE - METHOD FOR MEASURING THE MICROBIAL CONTAMINATION REDUCTION International Electrotechnical Committee
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IEC 62541-100 : 1ED 2015
IEC 62541-100 : 1ED 2015 OPC UNIFIED ARCHITECTURE - PART 100: DEVICE INTERFACE International Electrotechnical Committee
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IEC 62541-11 : 1ED 2015
IEC 62541-11 : 1ED 2015 OPC UNIFIED ARCHITECTURE - PART 11: HISTORICAL ACCESS International Electrotechnical Committee
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IEC 60079-29-2 REDLINE : 2ED 2015
IEC 60079-29-2 REDLINE : 2ED 2015 EXPLOSIVE ATMOSPHERES - PART 29-2: GAS DETECTORS - SELECTION, INSTALLATION, USE AND MAINTENANCE OF DETECTORS FOR FLAMMABLE GASES AND OXYGEN International Electrotechnical Committee
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IEC 62047-16 : 1ED 2015
IEC 62047-16 : 1ED 2015 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 16: TEST METHODS FOR DETERMINING RESIDUAL STRESSES OF MEMS FILMS - WAFER CURVATURE AND CANTILEVER BEAM DEFLECTION METHODS International Electrotechnical Committee
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IEC 62014-5 : 1ED 2015
IEC 62014-5 : 1ED 2015 QUALITY OF ELECTRONIC AND SOFTWARE INTELLECTUAL PROPERTY USED IN SYSTEM AND SYSTEM ON CHIP (SOC) DESIGNS International Electrotechnical Committee
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IEC 62014-4 : 1ED 2015
IEC 62014-4 : 1ED 2015 IP-XACT, STANDARD STRUCTURE FOR PACKAGING, INTEGRATING, AND REUSING IP WITHIN TOOL FLOWS International Electrotechnical Committee
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IEC 62047-15 : 1ED 2015
IEC 62047-15 : 1ED 2015 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 15: TEST METHOD OF BONDING STRENGTH BETWEEN PDMS AND GLASS International Electrotechnical Committee
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IEC 61523-4 : 1ED 2015
IEC 61523-4 : 1ED 2015 DESIGN AND VERIFICATION OF LOW-POWER INTEGRATED CIRCUITS International Electrotechnical Committee
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