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BS EN IEC 60749-17:2019
M00012356
New product
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation
British Standards Institution
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Abstract
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | British Standards Institution |
| ProductNote | THIS STANDARD ALSO REFERS TO ASTM E 1018 |
| Committee | EPL/47 |
| Supersedes |
|