Table of Contents

1 -  AS ISO 18118-2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy„Guide to the us
4 -  PREFACE
5 -  CONTENTS
6 -  INTRODUCTION
7 -  1 Scope
7 -  2 Normative references
7 -  3 Terms and definitions
8 -  4 Symbols and abbreviated terms
9 -  5 General information
10 -  6 Measurement conditions
10 -  6.1 General
10 -  6.2 Excitation source
10 -  6.3 Energy resolution
10 -  6.4 Energy step and scan rate
10 -  6.5 Signal intensity
10 -  6.6 Gain and time constant (for AES instruments with analogue detection systems)
10 -  6.7 Modulation to generate a derivative spectrum
11 -  7 Data-analysis procedures
11 -  8 Intensity-energy response function
11 -  9 Determination of chemical composition using relative sensitivity factors
11 -  9.1 Calculation of chemical composition
12 -  9.2 Uncertainties in calculated compositions
13 -  Annex A (normative) Equations for relative sensitivity factors
23 -  Annex B (informative) Information on uncertainty of the analytical results
26 -  Bibliography

Abstract

Adopts ISO 18118:2004 to give guidance on the measurement and use of experimentally determined relative sensitivity factors for quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Standards Australia
ProductNote	Pending Revision indicates that as a result of the Aged Standards review process, the document needs updating. If no project proposal, meeting the quality criteria, is received within the 12 month timeframe, the document shall be withdrawn.
Pages
ISBN
Committee	CH-016
Supersedes	DR 06411 CP