Table of Contents

1 -  AS 2879.7-1997 ALUMINA - DETERMINATION OF TRACE ELEMENTS - WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRIC METHOD
4 -  PREFACE
5 -  CONTENTS
6 -  1 SCOPE
6 -  2 REFERENCED DOCUMENTS
7 -  3 PRINCIPLE
7 -  4 REAGENTS AND MATERIALS
7 -  4.1 Flux
7 -  4.2 Aluminium oxide
7 -  4.3 Sodium tetraborate
7 -  4.4 Silicon dioxide
7 -  4.5 Iron( III) oxide
7 -  4.6 Calcium carbonate
7 -  4.7 Titanium dioxide
7 -  4.8 Ammonium dihydrogen orthophosphate
7 -  4.9 Vanadium pentoxide
7 -  4.10 Zinc oxide
8 -  4.11 Manganese oxide
8 -  4.12 Gallium oxide
8 -  4.13 Potassium carbonate
8 -  4.14 Copper oxide
8 -  4.15 Chromium( III) oxide
8 -  4.16 Nickel( II) oxide (NiO),
8 -  5 APPARATUS
8 -  5.1 Crucible
8 -  5.2 Desiccator
8 -  5.3 Electric furnace
8 -  5.4 Mould
8 -  5.5 X-ray fluorescence spectrometer
8 -  5.6 Vibratory mill
8 -  5.7 Fusion equipment
8 -  6 SAMPLING AND SAMPLES
9 -  7 PROCEDURE
9 -  7.1 General
9 -  7.2 Preparation of calibration specimens
12 -  7.3 Preparation of sample
13 -  7.4 X-ray fluorescence measurement
15 -  8 CALCULATIONS
15 -  8.1 General
15 -  8.2 Calculation of net intensity
15 -  8.3 Comparison of duplicate measurements for the Al2O3 blanks and SCDs
16 -  8.4 Drift correction of measured intensities
16 -  8.5 Calculation of the calibration parameters
16 -  9 REPORTING OF RESULTS
17 -  10 PRECISION
17 -  11 TEST REPORT
18 -  APPENDIX A - MINIMIZATION OF CONTAMINATION AND CARE OF PLATINUM WARE
18 -  A1 REAGENTS AND INSTRUMENT
18 -  A2 PLATINUM WARE
18 -  A3 BLANK
19 -  APPENDIX B - EXAMPLE OF INSTRUMENT OPTIMIZATION
19 -  B1 SCOPE
19 -  B2 COUNTING STRATEGY
20 -  B3 SPECTRAL INTERFERENCE
25 -  APPENDIX C - CALCULATION OF REAGENT MASSES FOR DIFFERENT SAMPLE/FLUX COMBINATIONS AND SCDs OMITTING SOME ELEMENTS
26 -  APPENDIX D - PREPARATION OF A MONITOR DISC
27 -  APPENDIX E INTERLABORATORY TEST PROGRAM ANALYSIS OF NBS 699, REDUCTION-GRADE ALUMINA, STANDARD REFERENCE MATERIAL

Abstract

Sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorous, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel, expressed as the oxides on an as-received basis.

RECONFIRMATION NOTICE
Technical Committee MN-009 has reviewed the content of this publication and in accordance with Standards Australia procedures for reconfirmation, it has been determined that the publication is still valid and does not require change.
Certain documents referenced in the publication may have been amended since the original date of publication. Users are advised to ensure that they are using the latest versions of such documents as appropriate, unless advised otherwise in this Reconfirmation Notice.
Approved for reconfirmation in accordance with Standards Australia procedures for reconfirmation on 9 April 2013.
The following are represented on Technical Committee MN-009:

Australian Institute of Mining and Metallurgy
Australian Aluminium Council
Minerals Council of Australia
Royal Australian Chemical Institute


To view or download a copy of the reconfirmation notice please go to the reconfirmation link near the top of this page.

Scope

This Standard sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorus, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel (expressed as the oxides
Na2O, SiO2, Fe2O3, CaO, TiO2, P2O5, V2O5, ZnO, MnO, Ga2O3, K2O, CuO, Cr2O3
and NiO on an as-received basis).
The method is applicable to smelting-grade aluminium oxide. The concentration range covered for each of the components is given in Table 1.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Standards Australia
ProductNote	Reconfirmed 18-07-2013
Pages
ISBN
Committee	MN-009
Supersedes	DR 95136