M00050183
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TEST METHOD FOR TRACE METALLIC IMPURITIES IN ELECTRONIC GRADE ALUMINUM-COPPER, ALUMINUM-SILICON, AND ALUMINUM-COPPER-SILICON ALLOYS BY HIGH-MASS-RESOLUTION GLOW DISCHARGE MASS SPECTROMETER
American Society for Testing and Materials
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Availability date: 11/06/2021
CONTAINED IN VOL. 10.04, 2016 Describes the concentrations of trace metallic impurities in high purity (99.99 wt. % pure, or purer, with respect to metallic trace impurities) aluminum-copper, aluminum-silicon and aluminum-copper-silicon alloys with major alloy constituents.
Published | |
Document Type | Standard |
Status | Current |
Publisher | American Society for Testing and Materials |
Pages | |
ISBN | |
Committee | F 01 |