M00050370
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TEST METHODS FOR MEASURING RESISTIVITY AND HALL COEFFICIENT AND DETERMINING HALL MOBILITY IN SINGLE-CRYSTAL SEMICONDUCTORS
American Society for Testing and Materials
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Availability date: 11/06/2021
CONTAINED IN VOL. 10.04, 2016 Defines two procedures for measuring the resistively and Hall coefficient of single-crystal semiconductor specimens.
Published | |
Document Type | Standard |
Status | Current |
Publisher | American Society for Testing and Materials |
ProductNote | Reconfirmed 2008 |
Pages | |
ISBN | |
Committee | F 01 |