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ASTM F 1845 : 2008 : R2016
M00052069
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ASTM F 1845 : 2008 : R2016
TEST METHOD FOR TRACE METALLIC IMPURITIES IN ELECTRONIC GRADE ALUMINUM-COPPER, ALUMINUM-SILICON, AND ALUMINUM-COPPER-SILICON ALLOYS BY HIGH-MASS-RESOLUTION GLOW DISCHARGE MASS SPECTROMETER
American Society for Testing and Materials
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Abstract
CONTAINED IN VOL. 10.04, 2016 Describes the concentrations of trace metallic impurities in high purity (99.99 wt. % pure, or purer, with respect to metallic trace impurities) aluminum-copper, aluminum-silicon and aluminum-copper-silicon alloys with major alloy constituents.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | American Society for Testing and Materials |
| ProductNote | Reconfirmed 2016 |
| Committee | F 01 |