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ASTM C 1842 : 2016
M00052325
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ASTM C 1842 : 2016
TEST METHOD FOR THE ANALYSIS OF BORON AND SILICON IN URANIUM HEXFLUORIDE VIA FOURIER-TRANSFORM INFRARED (FTIR) SPECTROSCOPY
American Society for Testing and Materials
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Abstract
CONTAINED IN VOL. 12.01, 2016 Defines boron and silicon impurities as BF[3] and SiF[4] in uranium hexafluoride.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | American Society for Testing and Materials |
| Committee | C 26 |