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ASTM F 76 : 2008 : R2016

M00052607

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ASTM F 76 : 2008 : R2016

TEST METHODS FOR MEASURING RESISTIVITY AND HALL COEFFICIENT AND DETERMINING HALL MOBILITY IN SINGLE-CRYSTAL SEMICONDUCTORS

American Society for Testing and Materials

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Abstract

CONTAINED IN VOL. 10.04, 2016 Defines two procedures for measuring the resistively and Hall coefficient of single-crystal semiconductor specimens.

General Product Information

Document Type Standard
Status Current
Publisher American Society for Testing and Materials
ProductNote Reconfirmed 2016
Committee F 01