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BS EN 60749-9 : 2017

M00020639

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BS EN 60749-9 : 2017

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 9: PERMANENCE OF MARKING (IEC 60749-9:2017)

British Standards Institution

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Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Equipment<br>5 Safety precautions<br>6 Procedure<br>7 Failure criteria<br>8 Summary<br>Bibliography

Abstract

Describes whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.

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Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/47