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BS EN 60749-5 : 2017

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BS EN 60749-5 : 2017

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST

British Standards Institution

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Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 General<br>5 Equipment<br>6 Test conditions<br>7 Procedures<br>8 Failure criteria<br>9 Safety<br>10 Summary<br>Annex ZA (normative) - Normative references to international<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;publications with their corresponding European<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;publications

Abstract

Defines a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

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Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/47
Supersedes
  • BS EN 60749 : 1999
  • 00/203277 DC : AUGUST 2000