M00021203
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL (IEC 60749-28:2017)
British Standards Institution
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Availability date: 11/05/2021
FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Required equipment<br>5 Periodic tester qualification, waveform records, and<br> waveform verification requirements<br>6 CDM ESD testing requirements and procedures<br>7 CDM classification criteria<br>Annex A (normative) - Verification module (metal disc)<br> specifications and cleaning guidelines for verification<br> modules and testers<br>Annex B (normative) - Capacitance measurement of verification<br> modules (metal discs) sitting on a tester field plate <br> dielectric<br>Annex C (informative) - CDM test hardware and metrology<br> improvements<br>Annex D (informative) - CDM tester electrical schematic<br>Annex E (informative) - Sample oscilloscope setup and waveform<br>Annex F (informative) - Field-induced CDM tester discharge<br> procedures<br>Annex G (informative) - Waveform verification procedures<br>Annex H (informative) - Determining the appropriate charge delay<br> for full charging of a large module or device<br>Annex I (informative) - Electrostatic discharge (ESD) sensitivity<br> testing direct contact charged device model (DC-CDM)<br>Bibliography
Defines the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
Published | |
Document Type | Standard |
Status | Current |
Publisher | British Standards Institution |
Pages | |
ISBN | |
Committee | EPL/47 |