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BS IEC 62951-4:2019

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BS IEC 62951-4:2019

Semiconductor devices - Flexible and stretchable semiconductor devices Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices

British Standards Institution

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Abstract

This part of IEC 62951 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices.

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Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/47