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BS IEC 62951-3:2018

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BS IEC 62951-3:2018

Semiconductor devices. Flexible and stretchable semiconductor devices. Evaluation of thin film transistor characteristics on flexible substrates under bulging

British Standards Institution

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Abstract

This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging.

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Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/47