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MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - METHOD FOR THE DETERMINATION OF INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS
British Standards Institution
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Availability date: 11/05/2021
Foreword<br>Introduction<br>1 Scope<br>2 Normative references<br>3 Terms, definitions and abbreviated terms<br>4 Specimen preparation for cross-sectional imaging<br>5 Determination of an interface position<br>6 Detailed procedure for determining the position of<br> the interface<br>7 Uncertainty<br>Annex A (informative) - Examples of processing the<br> real TEM/STEM images for three image types<br>Annex B (informative) - Two main applications for<br> this method<br>Annex C (informative) - Calibration of scale unit: Pixel<br> size calibration<br>Bibliography
Describes a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials
Published | |
Document Type | Standard |
Status | Current |
Publisher | British Standards Institution |
Pages | |
ISBN | |
Committee | CII/9 |