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BS ISO 20263 : 2017

M00014448

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BS ISO 20263 : 2017

MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - METHOD FOR THE DETERMINATION OF INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS

British Standards Institution

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Table of Contents

Foreword<br>Introduction<br>1 Scope<br>2 Normative references<br>3 Terms, definitions and abbreviated terms<br>4 Specimen preparation for cross-sectional imaging<br>5 Determination of an interface position<br>6 Detailed procedure for determining the position of<br>&nbsp;&nbsp;the interface<br>7 Uncertainty<br>Annex A (informative) - Examples of processing the<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;real TEM/STEM images for three image types<br>Annex B (informative) - Two main applications for<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;this method<br>Annex C (informative) - Calibration of scale unit: Pixel<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;size calibration<br>Bibliography

Abstract

Describes a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials

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Document Type Standard
Status Current
Publisher British Standards Institution
Committee CII/9