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BS EN 62979 : 2017

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BS EN 62979 : 2017

PHOTOVOLTAIC MODULE - BYPASS DIODE - THERMAL RUNAWAY TEST (IEC 62979:2017)

British Standards Institution

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Table of Contents

FOREWORD <br>INTRODUCTION <br>1 Scope <br>2 Normative references <br>3 Terms and definitions <br>4 Thermal runaway test <br>5 Pass or fail criteria<br>6 Test report <br>Annex ZA (normative) - Normative references to <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;international publications with their <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;corresponding European publications

Abstract

Defines a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.

General Product Information

Document Type Standard
Status Current
Publisher British Standards Institution
Committee GEL/82