M00014504
New product
PHOTOVOLTAIC MODULE - BYPASS DIODE - THERMAL RUNAWAY TEST (IEC 62979:2017)
British Standards Institution
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Availability date: 11/05/2021
FOREWORD <br>INTRODUCTION <br>1 Scope <br>2 Normative references <br>3 Terms and definitions <br>4 Thermal runaway test <br>5 Pass or fail criteria<br>6 Test report <br>Annex ZA (normative) - Normative references to <br> international publications with their <br> corresponding European publications
Defines a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.
Published | |
Document Type | Standard |
Status | Current |
Publisher | British Standards Institution |
Pages | |
ISBN | |
Committee | GEL/82 |