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BS EN 62047-26 : 2016

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BS EN 62047-26 : 2016

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 26: DESCRIPTION AND MEASUREMENT METHODS FOR MICRO TRENCH AND NEEDLE STRUCTURES

British Standards Institution

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Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Description of trench structures in a micrometer scale<br>5 Description of needle structures in a micrometer scale<br>6 Measurement method<br>Annex A (informative) - Examples of measurement for<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;trench and needle structures in a micrometer scale<br>Annex B (informative) - Uncertainty in dimensional measurement<br>Bibliography

Abstract

Defines descriptions of trench structure and needle structure in a micrometer scale.

General Product Information

Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/47
Supersedes
  • 14/30294910 DC : 0