Table of Contents

1 Overview<br>2 Normative references<br>3 Definitions, acronyms, and abbreviations<br>4 TestAdapterDescription Schema<br>5 Schema - TestAdapterInstance.xsd<br>6 ATML TestAdapterDescription XML schema<br>&nbsp;&nbsp;names and locations<br>7 ATML XML schema extensibility<br>8 Conformance<br>Annex A (informative) - IEEE download website material<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;associated with this document<br>Annex B (informative) - Users information and examples<br>Annex C (informative) - Glossary<br>Annex D (informative) - Bibliography<br>Annex E (informative) - IEEE List of Participants

Abstract

Specifies an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	British Standards Institution
Pages
ISBN
Committee	EPL/501