Table of Contents

FOREWORD <br>1 Scope <br>2 Normative references<br>3 Terms and definitions<br>4 Test apparatus <br>5 Procedure neutron irradiated soft error test <br>6 Evaluation<br>7 Summary <br>Annex A (informative) - Additional information<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;for the applicable procurement specification <br>Annex B (informative) - White neutron test apparatus<br>Annex C (informative) - Failure rate calculation <br>Bibliography

Abstract

Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	British Standards Institution
Pages
ISBN
Committee	EPL/47
Supersedes	14/30299002 DC : 0