M00016039
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MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - QUANTITATIVE POINT ANALYSIS FOR BULK SPECIMENS USING WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPY
British Standards Institution
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Availability date: 11/05/2021
Foreword<br>Introduction<br>1 Scope<br>2 Normative references<br>3 Abbreviated terms<br>4 Procedure for quantification<br>5 Test report<br>Annex A (informative) - Physical effects and correction<br>Annex B (informative) - Outline of various correction<br> techniques<br>Annex C (informative) - Measurement of the k-ratios in<br> case of 'chemical effects'<br>Bibliography
Provides requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).
Published | |
Document Type | Standard |
Status | Current |
Publisher | British Standards Institution |
Pages | |
ISBN | |
Committee | CII/9 |
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