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BS ISO 22489 : 2016

M00016039

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BS ISO 22489 : 2016

MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - QUANTITATIVE POINT ANALYSIS FOR BULK SPECIMENS USING WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPY

British Standards Institution

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Table of Contents

Foreword<br>Introduction<br>1 Scope<br>2 Normative references<br>3 Abbreviated terms<br>4 Procedure for quantification<br>5 Test report<br>Annex A (informative) - Physical effects and correction<br>Annex B (informative) - Outline of various correction<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;techniques<br>Annex C (informative) - Measurement of the k-ratios in<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;case of 'chemical effects'<br>Bibliography

Abstract

Provides requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).

General Product Information

Document Type Standard
Status Current
Publisher British Standards Institution
Committee CII/9
Supersedes
  • 05/30118737 DC : DRAFT SEP 2005