Table of Contents

FOREWORD <br>INTRODUCTION <br>1 Scope <br>2 Normative references <br>3 Terms and definitions <br>4 Requirements <br>5 Sampling plan <br>6 Test methods <br>7 Identification, labelling, packaging, delivery condition <br>8 Measurement of Curie temperature <br>9 Measurement of lattice constant (Bond method) <br>10 Measurement of face angle by X-ray<br>11 Measurement of bulk resistivity <br>12 Visual inspections - Front surface inspection method <br>Annex A (normative) - Expression using Euler angle <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;description for piezoelectric single crystals <br>Annex B (informative) - Manufacturing process <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;for SAW wafers <br>Bibliography<br>Annex ZA (normative) - Normative references to <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;international publications with their <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;corresponding European publications

Abstract

Pertains to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

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Published
Document Type	Standard
Status	Current
Publisher	British Standards Institution
Pages
ISBN
Committee	EPL/49
Supersedes	BS PD IEC/PAS 62276 : 2002 09/30207175 DC : 0 03/108069 DC : DRAFT MAY 2003 15/30318551 DC : 0