Table of Contents

1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Principle of measurement<br>5 Test environment<br>6 Apparatus<br>7 Test pieces<br>8 Procedure<br>9 Calculation<br>10 Limits to step height<br>11 Test report<br>Annex A (informative) - Effect of amplification factor<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;and levelling error on measured layer thickness

Abstract

Describes a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	British Standards Institution
Pages
ISBN
Committee	RPI/13