New Reduced price! BS EN 62047-25 : 2016 View larger

BS EN 62047-25 : 2016

M00016476

New product

BS EN 62047-25 : 2016

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 25: SILICON BASED MEMS FABRICATION TECHNOLOGY - MEASUREMENT METHOD OF PULL-PRESS AND SHEARING STRENGTH OF MICRO BONDING AREA

British Standards Institution

More details

In stock

$35.10

-55%

$78.00

More info

Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Requirements<br>5 Testing method<br>Annex A (informative) - Dimensions for testing<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;structure and tensile/compressive strength<br>Annex B (informative) - Pull-press testing method<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;example<br>Annex ZA (normative) - Normative references to<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;international publications with their<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;corresponding European publications

Abstract

Defines the in-situ testing method to measure the bonding strength of micro bonding area which is fabricated by micromachining technologies used in silicon-based micro-electromechanical system (MEMS).

General Product Information

Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/47
Supersedes
  • 14/30296140 DC : 0