M00016685
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DEVICE EMBEDDED SUBSTRATE - PART 2-4: GUIDELINES - TEST ELEMENT GROUPS (TEG)
British Standards Institution
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Availability date: 11/05/2021
FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terms, definitions and abbreviations<br>4 Test conditions and sample preparation<br>5 TEG<br>Bibliography
Defines the test element group devices useful when measuring basic properties of device embedded substrates.
Published | |
Document Type | Standard |
Status | Current |
Publisher | British Standards Institution |
Pages | |
ISBN | |
Committee | EPL/501 |