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BS PD IEC TS 62878-2-4 : 2015

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BS PD IEC TS 62878-2-4 : 2015

DEVICE EMBEDDED SUBSTRATE - PART 2-4: GUIDELINES - TEST ELEMENT GROUPS (TEG)

British Standards Institution

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Table of Contents

FOREWORD<br>INTRODUCTION<br>1 Scope<br>2 Normative references<br>3 Terms, definitions and abbreviations<br>4 Test conditions and sample preparation<br>5 TEG<br>Bibliography

Abstract

Defines the test element group devices useful when measuring basic properties of device embedded substrates.

General Product Information

Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/501