M00020017
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) (IEC 60749-26:2018)
British Standards Institution
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Availability date: 11/05/2021
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Apparatus and required equipment<br>5 Stress test equipment qualification and routine verification<br>6 Classification procedure<br>7 Failure criteria<br>8 Component classification<br>Annex A (informative) - HBM test method flow chart<br>Annex B (informative) - HBM test equipment parasitic properties<br>Annex C (informative) - Example of testing a product using<br> Table 2, Table 3, or Table 2 with a two-pin HBM tester<br>Annex D (informative) - Examples of coupled non-supply pin pairs<br>Annex E (normative) - Cloned non-supply (I/O) pin sampling<br> test method<br>Bibliography
Defines the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
Published | |
Document Type | Standard |
Status | Current |
Publisher | British Standards Institution |
Pages | |
ISBN | |
Committee | EPL/47 |