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BS EN IEC 60749-26 : 2018

M00020017

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BS EN IEC 60749-26 : 2018

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) (IEC 60749-26:2018)

British Standards Institution

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Table of Contents

FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Apparatus and required equipment<br>5 Stress test equipment qualification and routine verification<br>6 Classification procedure<br>7 Failure criteria<br>8 Component classification<br>Annex A (informative) - HBM test method flow chart<br>Annex B (informative) - HBM test equipment parasitic properties<br>Annex C (informative) - Example of testing a product using<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;Table 2, Table 3, or Table 2 with a two-pin HBM tester<br>Annex D (informative) - Examples of coupled non-supply pin pairs<br>Annex E (normative) - Cloned non-supply (I/O) pin sampling<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;test method<br>Bibliography

Abstract

Defines the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

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Document Type Standard
Status Current
Publisher British Standards Institution
Committee EPL/47