M00020024
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TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARD AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES - PART 5-503: GENERAL TEST METHOD FOR MATERIALS AND ASSEMBLIES - CONDUCTIVE ANODIC FILAMENTS (CAF) TESTING OF CIRCUIT BOARDS (IEC 61189-5-503:2017)
British Standards Institution
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Availability date: 11/05/2021
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Testing condition<br>5 Specimen<br>6 Equipment/Apparatus or material<br>7 Resistance measurement method<br>8 Test method<br>9 Procedure<br>Annex A (informative) - Forms of electrochemical<br> migration<br>Bibliography<br>Annex ZA (normative) - Normative references to<br> international publications with their<br> corresponding European publications
Defines the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).
Published | |
Document Type | Standard |
Status | Current |
Publisher | British Standards Institution |
Pages | |
ISBN | |
Committee | EPL/501 |