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BS PD IEC/TR 63133 : 2017
M00020169
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BS PD IEC/TR 63133 : 2017
SEMICONDUCTOR DEVICES - SCAN BASED AGEING LEVEL ESTIMATION FOR SEMICONDUCTOR DEVICES
British Standards Institution
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Table of Contents
FOREWORD <br>INTRODUCTION <br>1 Scope <br>2 Normative references <br>3 Terms, definitions and abbreviated terms <br>4 Ageing level<br>Bibliography
Abstract
Defines a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | British Standards Institution |
| Committee | EPL/47 |