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IEC 62969-4:2018 Ed 1.0

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IEC 62969-4:2018 Ed 1.0

Semiconductor devices – Semiconductor interface for automotive vehicles – Part 4: Evaluation method of data interface for automotive vehicle sensors

International Electrotechnical Committee

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Scope

This part of IEC 62969 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface

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Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47