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IEC TR 63133 : 1ED 2017
M00030688
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IEC TR 63133 : 1ED 2017
SEMICONDUCTOR DEVICES - SCAN BASED AGEING LEVEL ESTIMATION FOR SEMICONDUCTOR DEVICES
International Electrotechnical Committee
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Table of Contents
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Ageing level
Bibliography
Abstract
Describes a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 47 |