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IEC 62884-2 : 1ED 2017

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IEC 62884-2 : 1ED 2017

MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETRIC AND ELECTROSTATIC OSCILLATORS - PART 2: PHASE JITTER MEASUREMENT METHOD

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>INTRODUCTION<br>1 Scope <br>2 Normative references <br>3 Terms and definitions <br>4 Test and measurement procedures <br>5 Measurement and the measurement environment <br>6 Measurement<br>7 Other points to be noted <br>8 Miscellaneous <br>Annex A (normative) - Calculation method for the<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;amount of phase jitter<br>Bibliography

Abstract

Describes the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an 'Oscillator') and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 49