Table of Contents

FOREWORD<br>INTRODUCTION<br>1 Scope <br>2 Normative references <br>3 Terms and definitions <br>4 Product categories and applications <br>5 Failure<br>6 Reliability test <br>7 Stress test methods<br>8 Supplementary tests <br>9 Summary table of assumptions <br>10 Summary<br>Bibliography

Abstract

Provides guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs).

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 47