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IEC 61189-5-503 : 1ED 2017

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IEC 61189-5-503 : 1ED 2017

TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARD AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES - PART 5-503: GENERAL TEST METHOD FOR MATERIALS AND ASSEMBLIES - CONDUCTIVE ANODIC FILAMENTS (CAF) TESTING OF CIRCUIT BOARDS

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>1 Scope <br>2 Normative references <br>3 Terms and definitions <br>4 Testing condition<br>5 Specimen <br>6 Equipment/Apparatus or material<br>7 Resistance measurement method <br>8 Test method <br>9 Procedure <br>Annex A (informative) - Forms of electrochemical migration<br>Bibliography

Abstract

Describes the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 91