New Reduced price! IEC 62951-1 : 1ED 2017 View larger

IEC 62951-1 : 1ED 2017

M00030894

New product

IEC 62951-1 : 1ED 2017

SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 1: BENDING TEST METHOD FOR CONDUCTIVE THIN FILMS ON FLEXIBLE SUBSTRATES

International Electrotechnical Committee

More details

In stock

$35.10

-55%

$78.00

More info

Table of Contents

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Test piece
5 Testing method and test apparatus
6 Test report
Annex A (informative) - X-Y-Theta bending test method
Annex B (informative) - Data analysis: Calculation
        of bending radius and bending strain
Bibliography

Abstract

Describes a bending test method to measure the electromechanical properties or flexibility of conductive thin films deposited or bonded on flexible non-conductive substrates.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47