M00031173
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EMC IC MODELLING - PART 4: MODELS OF INTEGRATED CIRCUITS FOR RF IMMUNITY BEHAVIOURAL SIMULATION - CONDUCTED IMMUNITY MODELLING (ICIM-CI)
International Electrotechnical Committee
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Availability date: 11/05/2021
FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms, definitions, abbreviations and<br> conventions<br>4 Philosophy<br>5 ICIM-CI model description<br>6 CIML format<br>7 Extraction<br>8 Validation of ICIM-CI hypotheses<br>9 Model usage<br>Annex A (normative) - Preliminary definitions<br> for XML representation<br>Annex B (informative) - ICIM-CI example<br> with disturbance load<br>Annex C (informative) - Conversions between<br> parameter types<br>Annex D (informative) - Example of ICIM-CI<br> macro-model in CIML format<br>Annex E (normative) - CIML Valid keywords<br> and usage<br>Annex F (informative) - PDN impedance<br> measurement methods using vector network<br> analyzer<br>Annex G (informative) - RFIP measurement<br> method description<br>Annex H (informative) - Immunity simulation<br> with ICIM model based on pass/fail test<br>Annex I (informative) - Immunity simulation<br> with ICIM model based on non pass/fail<br> test<br>Bibliography
Defines a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC).
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Pages | |
ISBN | |
Committee | TC 47 |