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IEC 61671-6 : 1ED 2016

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IEC 61671-6 : 1ED 2016

STANDARD FOR AUTOMATIC TEST MARKUP LANGUAGE (ATML) TEST STATION DESCRIPTION

International Electrotechnical Committee

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Table of Contents

1 Overview<br>2 Normative references<br>3 Definitions, acronyms, and abbreviations<br>4 Schema - TestStationDescription.xsd<br>5 Schema - TestStationInstance.xsd<br>6 ATML TestStationDescription XML<br>&nbsp;&nbsp;schema names and locations<br>7 ATML XML schema extensibility<br>8 Conformance<br>Annex A (informative) - IEEE download website material<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;associated with this document<br>Annex B (informative) - User's information and examples<br>Annex C (informative) - Glossary<br>Annex D (informative) - Bibliography<br>Annex E (informative) - IEEE List of Participants

Abstract

Specifies an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.

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Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 91