M00031230
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STANDARD FOR AUTOMATIC TEST MARKUP LANGUAGE (ATML) TEST STATION DESCRIPTION
International Electrotechnical Committee
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Availability date: 11/05/2021
1 Overview<br>2 Normative references<br>3 Definitions, acronyms, and abbreviations<br>4 Schema - TestStationDescription.xsd<br>5 Schema - TestStationInstance.xsd<br>6 ATML TestStationDescription XML<br> schema names and locations<br>7 ATML XML schema extensibility<br>8 Conformance<br>Annex A (informative) - IEEE download website material<br> associated with this document<br>Annex B (informative) - User's information and examples<br>Annex C (informative) - Glossary<br>Annex D (informative) - Bibliography<br>Annex E (informative) - IEEE List of Participants
Specifies an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Pages | |
ISBN | |
Committee | TC 91 |