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IEC 61671-5 : 1ED 2016

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IEC 61671-5 : 1ED 2016

STANDARD FOR AUTOMATIC TEST MARKUP LANGUAGE (ATML) TEST ADAPTER DESCRIPTION

International Electrotechnical Committee

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Table of Contents

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestAdapterDescription Schema
5 Schema - TestAdapterInstance.xsd
6 ATML TestAdapterDescription XML schema
  names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website material
        associated with this document
Annex B (informative) - Users information and examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
Annex E (informative) - IEEE List of Participants

Abstract

Specifies an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 91