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SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 26: DESCRIPTION AND MEASUREMENT METHODS FOR MICRO TRENCH AND NEEDLE STRUCTURES
International Electrotechnical Committee
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Availability date: 11/05/2021
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Description of trench structures in a micrometer
scale
5 Description of needle structures in a micrometer
scale
6 Measurement method
Annex A (informative) - Examples of measurement for
trench and needle structures in a micrometer
scale
Annex B (informative) - Uncertainty in dimensional
measurement
Bibliography
Defines descriptions of trench structure and needle structure in a micrometer scale.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Pages | |
ISBN | |
Committee | TC 47 |