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IEC 62047-26 : 1ED 2016

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IEC 62047-26 : 1ED 2016

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 26: DESCRIPTION AND MEASUREMENT METHODS FOR MICRO TRENCH AND NEEDLE STRUCTURES

International Electrotechnical Committee

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Table of Contents

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Description of trench structures in a micrometer
  scale
5 Description of needle structures in a micrometer
  scale
6 Measurement method
Annex A (informative) - Examples of measurement for
        trench and needle structures in a micrometer
        scale
Annex B (informative) - Uncertainty in dimensional
        measurement
Bibliography

Abstract

Defines descriptions of trench structure and needle structure in a micrometer scale.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47