Table of Contents

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Common test interface requirements
Annex A (normative) - Common test interface signal
        definitions for pin map
Annex B (informative) - Bibliography
Annex C (informative) - IEEE List of Participants

Abstract

Pertains to military and aerospace automatic test equipment (ATE) testing applications.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 91