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IEC 61338-1-5 : 1ED 2015

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IEC 61338-1-5 : 1ED 2015

WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY

International Electrotechnical Committee

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Table of Contents

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Measurement and related parameters
4 Calculation equations for R[i] and [sigma][i]
5 Preparation of specimen
6 Measurement equipment and apparatus
7 Measurement procedure
8 Example of measurement result
Annex A (informative) - Derivation of Equation (4) for R[i]
Annex B (informative) - Calculation uncertainty of parameters
Bibliography

Abstract

Specifies a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 49
Supersedes
  • IEC PAS 61338-1-5 : 1.0