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IEC 62878-1-1 : 1ED 2015
M00031470
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IEC 62878-1-1 : 1ED 2015
DEVICE EMBEDDED SUBSTRATE - PART 1-1: GENERIC SPECIFICATION - TEST METHODS
International Electrotechnical Committee
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Table of Contents
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 Test methods
5 Shipping inspection
Annex A (informative) - Related test methods
Bibliography
Abstract
Defines the test methods of passive and active device embedded substrates.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 91 |