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IEC TS 62878-2-4 : 1ED 2015
M00031516
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IEC TS 62878-2-4 : 1ED 2015
DEVICE EMBEDDED SUBSTRATE - PART 2-4: GUIDELINES - TEST ELEMENT GROUPS (TEG)
International Electrotechnical Committee
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Table of Contents
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 Test conditions and sample preparation
5 TEG
Bibliography
Abstract
Defines the test element group devices useful when measuring basic properties of device embedded substrates.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | International Electrotechnical Committee |
| Committee | TC 91 |