M00031532
New product
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 17: BULGE TEST METHOD FOR MEASURING MECHANICAL PROPERTIES OF THIN FILMS
International Electrotechnical Committee
In stock
Warning: Last items in stock!
Availability date: 11/05/2021
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Principle of bulge test
5 Test apparatus and environment
6 Specimen
7 Test procedure and analysis
8 Test report
Annex A (informative) - Determination of mechanical
properties
Annex B (informative) - Deformation measurement
techniques
Annex C (informative) - Example of test piece fabrication:
MEMS process
Bibliography
Defines the method for performing bulge tests on the free-standing film that is bulged within a window.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Pages | |
ISBN | |
Committee | TC 47 |