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IEC 62047-17 : 1ED 2015

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IEC 62047-17 : 1ED 2015

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 17: BULGE TEST METHOD FOR MEASURING MECHANICAL PROPERTIES OF THIN FILMS

International Electrotechnical Committee

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Table of Contents

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Principle of bulge test
5 Test apparatus and environment
6 Specimen
7 Test procedure and analysis
8 Test report
Annex A (informative) - Determination of mechanical
        properties
Annex B (informative) - Deformation measurement
        techniques
Annex C (informative) - Example of test piece fabrication:
        MEMS process
Bibliography

Abstract

Defines the method for performing bulge tests on the free-standing film that is bulged within a window.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 47