Table of Contents

FOREWORD
PREFACE
CLAUSE
1 General requirements and precautions
  1.1 Semiconductor diodes
  1.2 External cavities
2 Methods of measurement
  2.1 Reflector current
  2.2 Power
  2.3 Pulse measurements
  2.4 Frequency
  2.5 Spectrum width
  2.6 Tuning
  2.7 Hysteresis
  2.8 Heater modulation effect
  2.9 Frequency-pulling figure
  2.10 Temperature coefficient of frequency
  2.11 Spurious mode oscillation

Abstract

Gives general requirements and precautions which apply when making measurements on low-power oscillator klystrons.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 39