New Reduced price! IEC 61124 : 3.0 View larger

IEC 61124 : 3.0

M00035892

New product

IEC 61124 : 3.0

RELIABILITY TESTING - COMPLIANCE TESTS FOR CONSTANT FAILURE RATE AND CONSTANT FAILURE INTENSITY

International Electrotechnical Committee

More details

In stock

$35.10

-55%

$78.00

More info

Table of Contents

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations
   and symbols
4 General requirements and area of application
5 General test procedure
6 Sequential test plans
7 Fixed time/failure terminated test
   plans - Fixed duration test plans
8 Design of alternative time/failure terminated
   test plans
9 Calendar time/failure terminated test plans for
   non-replaced items
10 Combined test plans
11 Performing the test
12 Presentation of results
Annex A (normative) - Tables and graphs for sequential
        test plans
Annex B (normative) - Graphs for fixed time/failure
        terminated test plans
Annex C (normative) - Graphs for alternative time/failure
        terminated test plans
Annex D (normative) - Tables and graphs for combined
        test plans and additional sequential test plans
Annex E (informative) - Examples and mathematical
        references for sequential test plans
Annex F (informative) - Design of sequential test plans
        using a common spreadsheet program
Annex G (informative) - Examples and mathematical
        references for fixed time/failure terminated test
        plans - Fixed duration test plans
Annex H (informative) - Design of fixed duration
        time/failure terminated test plans using
        a spreadsheet program
Annex I (informative) - Examples and mathematical
        references for the design of alternative
        time/failure terminated test plans
Annex J (informative) - Examples and mathematical
        references for the calendar time terminated
        test plans
Annex K (informative) - Derivation and mathematical
        reference for the optimized test plans of
        GOST R 27 402
Bibliography

Abstract

Provides a number of optimized test plans, the corresponding operating characteristic curves and expected test times.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee TC 56