Table of Contents

Foreword
Introduction
Clause
   1.1 Scope
   2.11 Intrinsic error test
   2.12 Additional error due to zero displacement
   2.13 Mutual influence of different measuring circuits
        of multiple and multiple channel recorders
   4.20 Determination of the value of the dead band
6 Influence of parasitic quantities
   6.1 Common mode interference
   6.2 Series (parallel) mode interference
7 Test of dynamic performance
   7.1 Response time
   7.2 Frequency response range
   7.3 Overshoot

Abstract

Gives details of tests that are specific to X-t recorders.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 85