M00036055
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SEMICONDUCTOR DEVICES - PART 14-2: SEMICONDUCTOR SENSORS - HALL ELEMENTS
International Electrotechnical Committee
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Availability date: 11/06/2021
FOREWORD
INTRODUCTION
1 General
1.1 Scope
1.2 Normative references
1.3 Definitions
1.4 Symbols
2 Essential ratings and characteristics
2.1 General
2.2 Ratings (limiting values)
2.3 Characteristics
3 Measuring methods
3.1 General
3.2 Output Hall voltage (VH)
3.3 Offset voltage (Vo)
3.4 Input resistance (Rin)
3.5 Output resistance (Rout)
3.6 Temperature coefficient of output Hall voltage
(aVH)
3.7 Temperature coefficient of input resistance
(aRin)
Defines standards for packaged semiconductor Hall elements that utilize the Hall effect.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Pages | |
ISBN | |
Committee | TC 47 |