M00036073
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
International Electrotechnical Committee
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Availability date: 11/06/2021
FOREWORD
1 Purpose
2 Scope
3 Reference document
4 Terms and definitions
5 Circuit schematic for the CDM simulator
6 Simulator waveform verification
7 Measurement instrumentation
8 Measurement procedure
9 Waveform characteristics
10 Voltage levels
11 Test procedure
12 Failure criteria
13 Supplementary information
Figures
Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Pages | |
ISBN | |
Committee | TC 47 |