Table of Contents

&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;Foreword<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;Introduction<br>1 Scope and object<br>2 Measuring parameters<br>3 Theory and calculation equations<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;3.1 Relative permittivity and loss factor<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;3.2 Determination of the relative conductivity of<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;conducting plates <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;3.3 Temperature coefficient of resonance frequency<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;3.4 Temperature dependence of tan d<br>4 Preparation of dielectric specimen<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.1 Preparation of standard dielectric rods<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;4.2 Preparation of test specimen<br>5 Measurement equipment and apparatus<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.1 Measurement equipment<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.2 Measurement apparatus for complex permittivity<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;5.3 Measurement apparatus for temperature coefficient<br>6 Measurement procedure<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.1 Measurement procedure for complex permittivity<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;6.2 Measurement procedure for temperature coefficient<br>7 Accuracy and error estimation<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;7.1 Measurement error due to the size of conducting <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;plates<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;7.2 Measurement error of relative conductivity<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;7.3 Errors due to the airgap between dielectric rod <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;and conducting plates or to field disturbance<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;7.4 Result of round robin test (RRT)<br>Annex A - Bibliography<br>Figure 1 - Configuration of a cylindrical dielectric rod <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;resonator short-circuited at both ends by two <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;parallel conducting plates<br>Figure 2 - Chart for relative permittivity calculation using<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;TE01l mode<br>Figure 3 - Confirmation of standard dielectric rod resonators <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;for measurement of conductivity of conducting <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;plates<br>Figure 4 - Temperature dependence of fo (Figure 4a) and tan d<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;(Figure 4b) for five kinds of dielectrics (e1 = 21,<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;25, 30, 38 and 90)<br>Figure 5 - Mode chart of a dielectric rod resonator short-<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;circuited at both ends by parallel conducting <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;plates<br>Figure 6 - Schematic diagram of measurement equipment<br>Figure 7 - Measurement apparatus for complex permittivity<br>Figure 8 - Measurement apparatus for temperature coefficient<br>Figure 9 - Frequency response for TE011 mode resonator having <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;e1 = 37,5, d = 8,00 mm and h = 3,3 mm)<br>Figure 10 - Insertion attenuation IAo, resonance frequency fo<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;and half-power bandwidth Df<br>Figure 11 - Measurement error on e1 and tan d by the size <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;ratio of d'ld<br>Table 1 - Examples of dimensions for standard dielectric rods<br>Table 2 - Example of TE01l mode resonance frequency for <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;various e1 and dimensions of a dielectric specimen<br>Table 3 - Recommended dimensions and materials for conducting<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;plate

Abstract

Describes the measurement methods of the complex relative permittivity of dielectric resonator materials at microwave frequencies by means of the dielectric rod resonator method short-circuited at both ends by parallel conducting plates.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 49