M00036376
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SEMICONDUCTOR CONVERTERS - PART 2: SELF-COMMUTATED SEMICONDUCTOR CONVERTERS INCLUDING DIRECT D.C. CONVERTERS
International Electrotechnical Committee
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Availability date: 11/06/2021
Foreword<br>1 Scope<br>2 Normative References<br>3 Definitions<br> 3.1 Functions of converters<br> 3.2 Types of converters<br> 3.3 Converter circuit components<br> 3.4 Important properties of converters and <br> electronic valve devices<br> 3.5 Disturbances and electromagnetic compatibility<br> 3.6 Characteristics related to input and output<br> 3.7 Definitions of rated values<br> 3.8 Definitions related to cooling<br> 3.9 Definitions related to temperature<br> 3.10 Definitions related to tests<br>4 Additional Subscripts and Letter Symbols<br>5 Service Conditions<br> 5.1 Code of identification for cooling methods<br> 5.2 Environmental conditions<br> 5.2.1 Ambient air circulation<br> 5.2.2 Normal service conditions<br> 5.2.3 Unusual environmental service <br> conditions and design considerations<br> 5.3 Electrical service conditions<br> 5.3.1 Electrical environment specification<br> 5.3.2 Unknown site conditions<br> 5.4 Character of the load<br> 5.5 Immunity requirements<br> 5.5.1 AC supply<br> 5.5.2 DC supply<br> 5.5.3 Load conditions, load unbalance<br> 5.5.4 Electrical unusual service conditions <br> and performance requirements<br>6 Rated Values and Additional Characteristics<br> 6.1 General<br> 6.2 Rated values to be specified by the supplier<br> 6.2.1 Rated input values<br> 6.2.2 Rated output values<br> 6.3 Additional characteristics<br> 6.4 Marking<br>7 Tests<br> 7.1 General<br> 7.1.1 Classification of tests<br> 7.1.2 Performance of tests<br> 7.2 Test schedule for converter equipment and <br> converter assemblies<br> 7.3 Test specifications<br> 7.3.1 Visual inspection<br> 7.3.2 Checking of auxiliary devices<br> 7.3.3 Insulation test<br> 7.3.4 Checking of the protective devices<br> 7.3.5 Light load and functional test<br> 7.3.6 Rated output test<br> 7.3.7 Overcurrent test<br> 7.3.8 Temperature-rise test<br> 7.3.9 Power loss determination<br> 7.3.10 Measurement of total harmonic <br> distortion (THD) or total harmonic <br> factor (THF)<br> 7.3.11 Measurement of power factor<br> 7.3.12 Measurement of output voltage<br> 7.3.13 Confirmation of output voltage <br> adjustable range<br> 7.3.14 Output voltage unbalance test<br> 7.3.15 Confirmation of output frequency <br> adjustable range<br> 7.3.16 Output frequency tolerances band test<br> 7.3.17 Checking of the automatic control<br> 7.3.18 Short-circuit test<br> 7.3.19 Measurement of audible noise<br> 7.3.20 Immunity test<br> 7.3.21 Emission test<br> 7.3.22 Measurement of ripple voltage and <br> current<br> 7.3.23 Additional tests<br> 7.4 Tolerances<br>Annex A (informative) Example for testing high power <br> converters<br> A.1 Introduction<br> A.2 Basic concepts<br> A.3 Test procedures<br> A.3.1 Rated output test<br> A.3.2 Overcurrent test<br> A.3.3 Temperature-rise test<br> A.3.3.1 GTO and diode<br> A.3.3.2 Snubber circuits<br> A.3.3.3 DC capacitors<br> A.3.4 Power loss determination<br>Figure 1 - Maximum expected overvoltages versus duration of<br> transient<br>Figure 2 - Diagram for calculation of voltage unbalance factor<br>Figure A.1 - Example of a large converter<br>Figure A.2 - Test circuit of a converter assembly<br>Figure A.3 - Timing chart for GTO gate pulses<br>Table 1 - Immunity levels for stiff a.c. voltage connections<br>Table 2 - DC voltage tolerances<br>Table 3 - Relative peak-to-peak ripple factor<br>Table 4 - Test items<br>Table 5 - Tolerances of losses and efficiency
Covers all kinds of semiconductor converters of the self-commutated type as well as power converters containing at least a part of a self-commutated type, eg. indirect d.c. converters, a.c. converters and direct d.c. converters.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Electrotechnical Committee |
Pages | |
ISBN | |
Committee | TC 22 |
Supersedes |
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