Table of Contents

FOREWORD
1 General
  1.1 Scope
  1.2 Normative references
2 Technical data
  2.1 Units and symbols
  2.2 Terms and definitions
  2.3 Preferred values
  2.4 Marking
  2.5 Coding
  2.6 Packaging
  2.7 Storage
  2.8 Transportation
3 Quality assessment procedures
4 Test and measurement procedures
  4.1 General
  4.2 Standard atmospheric conditions
  4.3 Drying
  4.4 Visual examination and checking of dimensions
  4.5 Resistance
  4.6 Insulation resistance
  4.7 Voltage proof
  4.8 Variation of resistance with temperature
  4.9 Reactance
  4.10 Non-linear properties
  4.11 Voltage coefficient
  4.12 Noise
  4.13 Short time overload
  4.14 Temperature rise
  4.15 Robustness of the resistor body
  4.16 Robustness of terminations
  4.17 Solderability
  4.18 Resistance to soldering heat
  4.19 Rapid change of temperature
  4.20 Bump
  4.21 Shock
  4.22 Vibration
  4.23 Climatic sequence
  4.24 Damp heat, steady state
  4.25 Endurance
  4.26 Accidental overload test
  4.27 Single-pulse high-voltage overload test
  4.28 Periodic-pulse high-voltage overload test
  4.29 Component solvent resistance
  4.30 Solvent resistance of marking
  4.31 Mounting of surface mount resistors
  4.32 Shear test
  4.33 Substrate bending test
  4.34 Corrosion
  4.35 Flammability
  4.36 Operation at low temperature
  4.37 Damp heat, steady state, accelerated
  4.38 Electrostatic discharge
  4.39 Periodic-pulse overload test
  4.40 Whisker growth test
  4.41 Hydrogen sulphide test
Annex A (normative) Interpretation of sampling plans
        and procedures as described in IEC 60410 for
        use within the IECQ system
Annex B (normative) Rules for the preparation of detail
        specifications for resistors and capacitors for
        electronic equipment for use within the
        IECQ system
Annex C (informative) Example of test equipment for the
        periodic-pulse high-voltage overload test
Annex D (normative) Layout of the first page of a PCP/CQC
        specification
Annex E (normative) Requirements for capability approval
        test report
Annex F (informative) Letter symbols and abbreviations
Annex G (informative) Index table for test and measurement
        procedures
Annex Q (normative) Quality assessment procedures

Abstract

Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Electrotechnical Committee
Pages
ISBN
Committee	TC 40
Supersedes	IEC 61045-2-1 : 1.0 IEC 61045-1 : 1.0